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Search for "dark field" in Full Text gives 115 result(s) in Beilstein Journal of Nanotechnology.

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH3)2Cl]2

  • Elif Bilgilisoy,
  • Ali Kamali,
  • Thomas Xaver Gentner,
  • Gerd Ballmann,
  • Sjoerd Harder,
  • Hans-Peter Steinrück,
  • Hubertus Marbach and
  • Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

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  • , high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) was performed to analyze the morphology of the deposited nanoparticles. For this purpose, several FEBID structures were prepared on the SiO2 substrate with the size of 4 × 4 µm2 and an electron dose of 7.80 C/cm2. For
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Published 06 Dec 2023

Carboxylic acids and light interact to affect nanoceria stability and dissolution in acidic aqueous environments

  • Matthew L. Hancock,
  • Eric A. Grulke and
  • Robert A. Yokel

Beilstein J. Nanotechnol. 2023, 14, 762–780, doi:10.3762/bjnano.14.63

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  • dark-field scanning TEM and EDS were used to determine the elemental composition of some particles seen in TEM. In addition, camera photos were taken after 0, 1, 2, and 4 weeks of the samples exposed to citric acid and water under light and dark conditions. To identify the key functional groups that
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Published 27 Jun 2023

A novel approach to pulsed laser deposition of platinum catalyst on carbon particles for use in polymer electrolyte membrane fuel cells

  • Bogusław Budner,
  • Wojciech Tokarz,
  • Sławomir Dyjak,
  • Andrzej Czerwiński,
  • Bartosz Bartosewicz and
  • Bartłomiej Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 190–204, doi:10.3762/bjnano.14.19

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  • spatial resolution of 160 pm using the HAADF (high-angle annular dark-field) detector. Statistical analysis was performed on the HRTEM images using the Digimizer software. About 200 particles were measured to assess their mean area and area distribution. For the measurement of the chemical composition of
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Published 02 Feb 2023

Reliable fabrication of transparent conducting films by cascade centrifugation and Langmuir–Blodgett deposition of electrochemically exfoliated graphene

  • Teodora Vićentić,
  • Stevan Andrić,
  • Vladimir Rajić and
  • Marko Spasenović

Beilstein J. Nanotechnol. 2022, 13, 666–674, doi:10.3762/bjnano.13.58

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  • light path. Graphene film resistance was measured by inserting the substrates with electrodes into an electrode connector (DRP-CACIDE, Metrohm, Oviedo, Spain) and the acquiring resistance with a handheld digital multimeter. Optical dark-field microscopy of the films was performed with a magnification of
  • 10× (Olympus BX53M). Scanning electron microscopy (SEM) was performed with a FESEM (FEI Scios 2, Thermo Fisher Scientific, Waltham, MA, USA) at a chamber pressure of 1 × 10−4 Pa with electron beam voltages set between 1 and 30 kV, depending on the film. Films that are shown in optical dark-field
  • insight into the thickness and quality of these films, we performed optical dark-field microscopy with a magnification of 10×. Photographs of deposited graphene films from solutions processed at different centrifugation rates are depicted in Figure 3. Films made directly from the initial polydisperse
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Published 18 Jul 2022

A new method for obtaining the magnetic shape anisotropy directly from electron tomography images

  • Cristian Radu,
  • Ioana D. Vlaicu and
  • Andrei C. Kuncser

Beilstein J. Nanotechnol. 2022, 13, 590–598, doi:10.3762/bjnano.13.51

Graphical Abstract
  • microscopy (STEM) operation mode, using the high-angle annular dark-field (HAADF) detectors and an appropriate camera length. The TEM specimen was prepared by a standard powder method, using a 300 Mesh, lacey Carbon, Cu grid. X-ray diffraction (XRD) has been performed on MNPs using a Bruker D8 Advance
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Published 05 Jul 2022

Sputtering onto liquids: a critical review

  • Anastasiya Sergievskaya,
  • Adrien Chauvin and
  • Stephanos Konstantinidis

Beilstein J. Nanotechnol. 2022, 13, 10–53, doi:10.3762/bjnano.13.2

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Published 04 Jan 2022

Chemical vapor deposition of germanium-rich CrGex nanowires

  • Vladislav Dřínek,
  • Stanislav Tiagulskyi,
  • Roman Yatskiv,
  • Jan Grym,
  • Radek Fajgar,
  • Věra Jandová,
  • Martin Koštejn and
  • Jaroslav Kupčík

Beilstein J. Nanotechnol. 2021, 12, 1365–1371, doi:10.3762/bjnano.12.100

Graphical Abstract
  • nanowire using SAED, dark-field HRTEM, and EDX analysis showed that it consisted of a crystalline germanium core sheathed with an amorphous Cr/Ge coating (Figure 3 and Supporting Information File 1, Figure S7) resembling SiNWs with similar structure [12]. The determined d-spacing of 0.326 nm fits precisely
  • measurement unit with the bias applied to the tip, while the substrate was grounded. (a) SEM image of a Cr/Ge deposit with nanowires (b) growing in a tapering manner. Linear EDX analysis along a single nanowire. (a, c) Dark-field HRTEM images, (b) SAED of a nanowire piece, and (d) HRTEM image of a NW top
  • piece with magnified crystalline core and a determined d-spacing of 0.326 nm. The dark-field image corresponds to an indicated diffraction spot in the SAED image. Diffuse circles and individual points indicate the amorphous coating and crystalline germanium, respectively. XP spectra of (a) the Ge 3d and
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Published 07 Dec 2021

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

  • Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

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  • transmission electron microscopy (STEM), TEM, TEM selected area electron diffraction (SAED), and TEM dark-field (DF) measurements. The results for each experiment are compared to those of a non-irradiated area of the Cu TEM grid. Monte Carlo simulations of the occurring ion–solid interactions are evaluated to
  • ) were assessed individually and the results compared. TEM lamellae were prepared for irradiated areas and STEM, dark-field and bright-field measurements as well as TEM SAED measurements were performed to evaluate the crystal structure underneath the irradiated area. The corresponding measurements are
  • within the lattice. Furthermore, satellite peaks can be seen around the major reflections for this higher ion dose. To further assess the additional reflections, dark-field images were recorded for a satellite peak (see Figure 8a and Figure 8b). The bright areas in the dark-field image, which correspond
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Published 31 Aug 2021

Fate and transformation of silver nanoparticles in different biological conditions

  • Barbara Pem,
  • Marija Ćurlin,
  • Darija Domazet Jurašin,
  • Valerije Vrček,
  • Rinea Barbir,
  • Vedran Micek,
  • Raluca M. Fratila,
  • Jesus M. de la Fuente and
  • Ivana Vinković Vrček

Beilstein J. Nanotechnol. 2021, 12, 665–679, doi:10.3762/bjnano.12.53

Graphical Abstract
  • of incubation at room temperature, 10 μL of the reaction mixture aliquot was dropped on a TEM grid, air-dried, and examined by TEM. The images were taken using a 300 kV transmission electron microscope FEI Tecnai F30 (FEI Company, The Netherlands) equipped with a high angle annular dark field (HAADF
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Published 07 Jul 2021

The preparation temperature influences the physicochemical nature and activity of nanoceria

  • Robert A. Yokel,
  • Wendel Wohlleben,
  • Johannes Georg Keller,
  • Matthew L. Hancock,
  • Jason M. Unrine,
  • D. Allan Butterfield and
  • Eric A. Grulke

Beilstein J. Nanotechnol. 2021, 12, 525–540, doi:10.3762/bjnano.12.43

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  • characterizations. Transmission electron microscopy (TEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) were conducted of NM-212 dispersed in DI water, sonicated for 10 min in a bath, and captured on 300 mesh lacey carbon copper grids dipped into the dispersion for
  • nanoceria and their fate and effects. Transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy images of NM-212 and its chemical composition determined by energy-dispersive X-ray spectroscopy. (A, B) TEM images, (B) is a part of (A) at higher magnification
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Published 04 Jun 2021

Scanning transmission helium ion microscopy on carbon nanomembranes

  • Daniel Emmrich,
  • Annalena Wolff,
  • Nikolaus Meyerbröker,
  • Jörg K. N. Lindner,
  • André Beyer and
  • Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

Graphical Abstract
  • Technology, 2 George St, Brisbane 4000, QLD, Australia CNM Technologies, Bielefeld, Germany Department of Physics, Paderborn University, Paderborn, Germany 10.3762/bjnano.12.18 Abstract A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection
  • detector is able to determine the thickness of membranes with sub-nanometer precision by quantitatively evaluating the image signal and comparing the results with Monte Carlo simulations. The thickness determined by the dark-field transmission detector is compared to X-ray photoelectron spectroscopy and
  • energy-filtered transmission electron microscopy measurements. Keywords: carbon nanomembranes; dark field; helium ion microscopy (HIM); scanning transmission ion microscopy (STIM); SRIM simulations; Introduction Throughout the past decade, the helium ion microscope (HIM) has emerged as a versatile
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Published 26 Feb 2021

Bio-imaging with the helium-ion microscope: A review

  • Matthias Schmidt,
  • James M. Byrne and
  • Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

Graphical Abstract
  • . If a segmented detector with a central segment and ring segments was used, it would be even possible to distinguish between absorption contrast (bright-field imaging) and scatter-contrast (dark-field imaging). Compared to other imaging modes in the HIM, it can be anticipated that THIM will be the
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Published 04 Jan 2021

Free and partially encapsulated manganese ferrite nanoparticles in multiwall carbon nanotubes

  • Saja Al-Khabouri,
  • Salim Al-Harthi,
  • Toru Maekawa,
  • Mohamed E. Elzain,
  • Ashraf Al-Hinai,
  • Ahmed D. Al-Rawas,
  • Abbsher M. Gismelseed,
  • Ali A. Yousif and
  • Myo Tay Zar Myint

Beilstein J. Nanotechnol. 2020, 11, 1891–1904, doi:10.3762/bjnano.11.170

Graphical Abstract
  • ) bright-field and dark-field images were acquired at 80 kV. MnFe2O4 nanoparticles and MnFe2O4/MWCNTs samples were dispersed in absolute ethanol and sonicated for 15 min to obtain a homogenous dispersion. Then, the supernatant was micropipetted onto a TEM grid and dried at room temperature (approx. 300 K
  • of free MnFe2O4 nanoparticles at 300, 77, and 4 K. The inset shows as enlarged view of M–H loops. (b) Magnetization measurements under ZFC and FC conditions in an applied magnetic field of 50 Oe. (a) Dark-field STEM image. (b) Bright-field STEM image. (c) Annular dark-field image. EDS mapping of (d
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Published 29 Dec 2020

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

  • Eduardo Serralta,
  • Nico Klingner,
  • Olivier De Castro,
  • Michael Mousley,
  • Santhana Eswara,
  • Serge Duarte Pinto,
  • Tom Wirtz and
  • Gregor Hlawacek

Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167

Graphical Abstract
  • the sample with the position (scattering angle) and time of the transmission events. Various imaging modes, such as bright field and dark field or the direct image of the transmitted signal, can be created by post-processing the collected STIM data. Furthermore, the detector has high spatial and
  • also detect channeling-related contrast on polycrystalline silicon, thallium chloride nanocrystals, and single-crystalline silicon by comparing the signal transmitted at different directions for the same data set. Keywords: bright-field; channeling; dark-field; delay line detector; helium ion
  • very little, or no, deflection. In dark-field (DF) mode, the deflected part of the beam is used to generate the signal for the image. In annular dark-field (ADF) mode, the beam transmitted at a particular polar angle region is integrated over a complete annulus. Alternatively, the image can be formed
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Published 11 Dec 2020

Oxidation of Au/Ag films by oxygen plasma: phase separation and generation of nanoporosity

  • Abdel-Aziz El Mel,
  • Said A. Mansour,
  • Mujaheed Pasha,
  • Atef Zekri,
  • Janarthanan Ponraj,
  • Akshath Shetty and
  • Yousef Haik

Beilstein J. Nanotechnol. 2020, 11, 1608–1614, doi:10.3762/bjnano.11.143

Graphical Abstract
  • equipped with an FEI EDS detector and a high-angle annular dark-field (HAADF) detector operating at 200 kV. For qualitative elemental chemical analysis, ESPRIT software from Bruker was used. The cross-section film (thickness <100 nm) was prepared using a SEM/FIB Versa 3D dual beam instrument from FEI
  • ) oxide tetragonal phase JCDPS 01-084-1108. High-angle annular dark-field (HAADF) imaging (a) and color-coded STEM-EDS elemental mapping (b–e) showing the distribution of oxygen (green) (b), chromium (yellow) (c), silver (blue) (d) and gold (red) (e) after film oxidation for 30 min at 100 W. (F) RGB STEM
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Published 22 Oct 2020

One-step synthesis of carbon-supported electrocatalysts

  • Sebastian Tigges,
  • Nicolas Wöhrl,
  • Ivan Radev,
  • Ulrich Hagemann,
  • Markus Heidelmann,
  • Thai Binh Nguyen,
  • Stanislav Gorelkov,
  • Stephan Schulz and
  • Axel Lorke

Beilstein J. Nanotechnol. 2020, 11, 1419–1431, doi:10.3762/bjnano.11.126

Graphical Abstract
  • ) micrograph in Figure 2a. Pt-NPs (black dots) are homogeneously distributed across the entire porous carbon sheet (grey areas). The porosity of the support can be observed in the dark-field TEM micrograph (Figure 2b) and has been reported to be beneficial in electrocatalysis, as it reduces mass transport
  • [22][23]. Figure 2d shows a dark-field scanning transmission electron micrograph (STEM) of several Pt-NPs on a CNW sheet and corresponding energy dispersive spectroscopy (EDS) measurements of the platinum and carbon content. No significant amounts of other elements were detected. These measurements
  • occurs. a) Bright-field TEM micrograph of a typical Pt/CNW sheet, showing homogeneously distributed Pt-NPs (black dots). b) A dark-field TEM micrograph of a porous CNW. c) Histogram of the PSD of Pt-NPs, proving a narrow PSD with a geometric standard deviation of 1.24 and a small mean particle diameter
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Published 17 Sep 2020

Magnetic-field-assisted synthesis of anisotropic iron oxide particles: Effect of pH

  • Andrey V. Shibaev,
  • Petr V. Shvets,
  • Darya E. Kessel,
  • Roman A. Kamyshinsky,
  • Anton S. Orekhov,
  • Sergey S. Abramchuk,
  • Alexei R. Khokhlov and
  • Olga E. Philippova

Beilstein J. Nanotechnol. 2020, 11, 1230–1241, doi:10.3762/bjnano.11.107

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  • the coexistence between small spherical particles (giving diffraction rings) and larger rod-like particles (contributing mostly to point reflexes), as confirmed by TEM images taken in the dark-field mode. Almost all of the point reflexes are localized in the magnetite rings, confirming that spherical
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Published 17 Aug 2020

3D superconducting hollow nanowires with tailored diameters grown by focused He+ beam direct writing

  • Rosa Córdoba,
  • Alfonso Ibarra,
  • Dominique Mailly,
  • Isabel Guillamón,
  • Hermann Suderow and
  • José María De Teresa

Beilstein J. Nanotechnol. 2020, 11, 1198–1206, doi:10.3762/bjnano.11.104

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  • operated at 300 kV and equipped with a high-brightness X-FEG and a CETCOR Cs corrector for the condenser system to provide sub-angstrom probe size. STEM high-angle annular dark-field (HAADF) tomography was performed using a Thermo Fisher Tecnai field-emission gun operated at 300 kV. The angular range for
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Published 11 Aug 2020

Observation of unexpected uniaxial magnetic anisotropy in La2/3Sr1/3MnO3 films by a BaTiO3 overlayer in an artificial multiferroic bilayer

  • John E. Ordóñez,
  • Lorena Marín,
  • Luis A. Rodríguez,
  • Pedro A. Algarabel,
  • José A. Pardo,
  • Roger Guzmán,
  • Luis Morellón,
  • César Magén,
  • Etienne Snoeck,
  • María E. Gómez and
  • Manuel R. Ibarra

Beilstein J. Nanotechnol. 2020, 11, 651–661, doi:10.3762/bjnano.11.51

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  • using the pulsed-laser deposition technique. We analyzed the films structurally through X-ray reciprocal space maps and high-angle annular dark field microscopy, and magnetically via thermal demagnetization curves and in-plane magnetization versus applied magnetic field loops at room temperature. Our
  • varied the layer thicknesses. We structurally analyzed samples by reciprocal space maps (RSMs) around the pseudocubic (103) reflection in an X-ray diffractometer and high-angle annular dark field in scanning transmission electron microscopy (HAADF-STEM). Local strain maps were reconstructed by the
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Published 16 Apr 2020

Synthesis and acetone sensing properties of ZnFe2O4/rGO gas sensors

  • Kaidi Wu,
  • Yifan Luo,
  • Ying Li and
  • Chao Zhang

Beilstein J. Nanotechnol. 2019, 10, 2516–2526, doi:10.3762/bjnano.10.242

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  • the 0.5 wt % ZnFe2O4/rGO composite. Furthermore, the composition of the sample was analyzed by high-angle annular dark-field imaging scanning transmission electron microscopy (HAADF-STEM) and EDS. The element mappings in Figure 6e reveal the existence of C, Zn, Fe and O in the 0.5 wt % ZnFe2O4/rGO
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Published 16 Dec 2019

Gold-coated plant virus as computed tomography imaging contrast agent

  • Alaa A. A. Aljabali,
  • Mazhar S. Al Zoubi,
  • Khalid M. Al-Batanyeh,
  • Ali Al-Radaideh,
  • Mohammad A. Obeid,
  • Abeer Al Sharabi,
  • Walhan Alshaer,
  • Bayan AbuFares,
  • Tasnim Al-Zanati,
  • Murtaza M. Tambuwala,
  • Naveed Akbar and
  • David J. Evans

Beilstein J. Nanotechnol. 2019, 10, 1983–1993, doi:10.3762/bjnano.10.195

Graphical Abstract
  • high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) images further confirmed the existence of dimeric structures (Figure 5A), composed of a brighter core and a darker attachment. STEM-energy dispersive X-ray (EDX) elemental mapping measurements were conducted to analyze
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Published 07 Oct 2019

Fabrication and characterization of Si1−xGex nanocrystals in as-grown and annealed structures: a comparative study

  • Muhammad Taha Sultan,
  • Adrian Valentin Maraloiu,
  • Ionel Stavarache,
  • Jón Tómas Gudmundsson,
  • Andrei Manolescu,
  • Valentin Serban Teodorescu,
  • Magdalena Lidia Ciurea and
  • Halldór Gudfinnur Svavarsson

Beilstein J. Nanotechnol. 2019, 10, 1873–1882, doi:10.3762/bjnano.10.182

Graphical Abstract
  • white contrast seen in the high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) image (Figure 5b) emphasizes the Ge atoms density, revealing the morphology of the SiGe crystallites. The SiGe NCs have columnar/ellipsoidal morphology oriented with the large axis parallel to
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Published 17 Sep 2019

Nanoarchitectonics meets cell surface engineering: shape recognition of human cells by halloysite-doped silica cell imprints

  • Elvira Rozhina,
  • Ilnur Ishmukhametov,
  • Svetlana Batasheva,
  • Farida Akhatova and
  • Rawil Fakhrullin

Beilstein J. Nanotechnol. 2019, 10, 1818–1825, doi:10.3762/bjnano.10.176

Graphical Abstract
  • -decorated HeLa cells with dark-field microscopy (Figure 2B,C) to confirm formation and integrity of the inorganic layer. Dark-field microscopy at 1000× magnification is expected to resolve the rod-like shapes of halloysite [36]. This was confirmed in this study demonstrating the elongated tubular structures
  • processed using Nanoscope Analysis v.1.7. software (Bruker). For dark-field microscopy imaging HeLa cells were fixed and the nuclei were stained with DAPI. The Cytoviva® high annular aperture dark-field condenser attached to an Olympus BX51 upright microscope was used. The Olympus BX51 microscope was
  • equipped with a fluorite 100× objective and Dage xL (Dage-MTI) CCD camera. Images were obtained using Exponent 7 software (Dage-MTI). The dark-field images were overlapped with transmission fluorescence images using the image processing software GIMP. Cell proliferative activity was examined by flow
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Published 04 Sep 2019

Synthesis of nickel/gallium nanoalloys using a dual-source approach in 1-alkyl-3-methylimidazole ionic liquids

  • Ilka Simon,
  • Julius Hornung,
  • Juri Barthel,
  • Jörg Thomas,
  • Maik Finze,
  • Roland A. Fischer and
  • Christoph Janiak

Beilstein J. Nanotechnol. 2019, 10, 1754–1767, doi:10.3762/bjnano.10.171

Graphical Abstract
  • = 1,5-cyclooctadiene) and GaCp* (Cp* = pentamethylcyclopentadienyl) in the ionic liquid [BMIm][NTf2] selectively yields small intermetallic Ni/Ga nanocrystals of 5 ± 1 nm as derived from transmission electron microscopy (TEM) and high-angle annular dark-field scanning transmission electron microscopy
  • indicates a Ga(K)/O(K) ratio of 95:5 ± 4% (Figure 7). This ratio and the subsequent analyses by high-angle annular dark-field (HAADF)-scanning (S)TEM-EDX have to be interpreted very cautiously as EDX is not very well suited for the quantification of elements lighter than fluorine. HAADF-STEM images (Figure
  • annular dark-field scanning transmission electron microscopy (HAADF-STEM) was also performed with the FEI Tecnai G2 F20 electron microscope. All EDX spectra acquired in STEM mode were averaged scans over selected areas of about 100 × 100 nm2. The EDX spectra of an isolated particle were measured at
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Published 21 Aug 2019

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

  • Dominik Wrana,
  • Karol Cieślik,
  • Wojciech Belza,
  • Christian Rodenbücher,
  • Krzysztof Szot and
  • Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

Graphical Abstract
  • the high-angle annular dark-field imaging scanning transmission electron microscope (HAADF-STEM) mode as we have recently shown in [12]. A closer look at TiO reveals the γ-TiO structure in a Fm-3m space group and 2.1 Å unit cell, which stands in perfect agreement with subject literature values [27
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Published 02 Aug 2019
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